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Keyence VK-X3050
Measurement head. VK-X3050. Series: 3D Surface Profiler. Series code: VK-X3000 series
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Description
Measurement head. VK-X3050. Series: 3D Surface Profiler. Series code: VK-X3000 series
Specification
| Model Name | Measurement head |
|---|---|
| Model Code | VK-X3050 |
| Series Title | 3D Surface Profiler |
| Series Code | VK-X3000 series |
| Data Sheet URL | https://www.keyence.com/download/download/confirmation/?dlSeriesId=WS_157126&dlModelId=PM_15X3050&dlSiteId=1&dlLanguageId=en-US&dlLangType=en-US |
| Model | VK-X3050 |
| Type | Measurement head |
| Total magnification | 42 to 28800×*1 |
| Field of view | 11 to 7398 μm |
| Measurement principle | Laser confocal, Focus variation, White light interferometry, Spectral interference |
| Laser wavelength | Semiconductor laser, 661 nm |
| Max. laser measurement speed | Surface: 125 Hz, Line: 7900 Hz*2 |
| Max. laser output | 1.0 mW |
| Laser class | Class 2 Laser Product (IEC60825-1, FDA (CDRH) Part 1040.10*3) |
| Laser light-receiving element | 16-bit photomultiplier |
| White light source | White LED |
| White-light-receiving element | High-definition color CMOS |
| Laser confocal - Height display resolution | 1 nm |
| Laser confocal - Height repeatability σ | 10×: 100 nm, 20×: 40 nm, 50×: 20 nm |
| Laser confocal - Height accuracy | 0.2+L/ 100 μm or less*4 |
| Laser confocal - Width display resolution | 1 nm |
| Laser confocal - Width repeatability 3σ | 10×: 400 nm, 20×: 100 nm, 50×: 50 nm |
| Laser confocal - Width accuracy | Measured value ±2% or less*4 |
| Focus variation - Height display resolution | 1 nm |
| Focus variation - Height repeatability σ | 5×: 500 nm, 10×: 100 nm, 20×: 50 nm, 50×: 30 nm |
| Focus variation - Height accuracy | 0.2+L/ 100 μm or less*4 |
| Focus variation - Width display resolution | 1 nm |
| Focus variation - Width repeatability 3σ | 5×: 400 nm, 10×: 400 nm, 20×: 120 nm, 50×: 65 nm |
| Focus variation - Width accuracy | Measured value ±2% or less*4 |
| White light interferometry - Height display resolution | 0.01 nm |
| White light interferometry - Width display resolution | 0.1 nm |
| White light interferometry - Surface topography repeatability | 0.08 nm*5 |
| White light interferometry - Repeatability of RMS | 0.008 nm*5 |
| Spectral interference film thickness measurement - Repeatability σ | 0.1 nm*5 |
| Spectral interference film thickness measurement - Accuracy | ±0.6%*5 |
| Optical observation - Number of pixels | 5.6 million |
| Optical observation - Revolver | 6-hole electric revolver |
| Optical observation - Ring illumination lens | 2.5×, 5×, 10× |
| Optical observation - Optical zoom | 1 to 8× |
| XY stage configuration - Manual operation range | 70 × 70 mm 2.76” × 2.76” |
| XY stage configuration - Motorized operation range | 100 × 100 mm 3.94” × 3.94” |
| Power supply - Power voltage | 100 to 240 VAC, 50/60 Hz |
| Power supply - Power consumption | 150 VA |
| Environmental resistance - Ambient temperature | +15 to 28°C 59 to 82.4°F |
| Environmental resistance - Relative humidity | 20 to 80% RH (No condensation) |
| Weight | Approx. 13 kg |
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