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Keyence SI-F80R

Sensor Head, Wafer Thickness Measurement Type. SI-F80R. Series: Spectral-Interference Wafer Thickness Meter. Series code: SI-F80R series

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Description

Sensor Head, Wafer Thickness Measurement Type. SI-F80R. Series: Spectral-Interference Wafer Thickness Meter. Series code: SI-F80R series

Specification

Model Name

Sensor Head, Wafer Thickness Measurement Type

Model Code

SI-F80R

Series Title

Spectral-Interference Wafer Thickness Meter

Series Code

SI-F80R series

Data Sheet URL

https://www.keyence.com/download/download/confirmation/?dlSeriesId=WS_SR49623&dlModelId=PM_216F80R&dlSiteId=1&dlLanguageId=en-US&dlLangType=en-US

CAD URL

https://www.keyence.com/products/measure/spectral/si-f80r/downloads/?mode=cd&modelId=PM_216F80R

Model

SI-F80R*1

Type

Wafer thickness measurement type Sensor head

Measurement range

10 to 310 µm 0.000394" to 0.0122" (when n=3.5)*2

Possible detection distance

80 to 81.1 mm 3.15" to 3.19"

Light source

Infrared SLD Output 0.6 mW, Class 1 Laser Product (IEC60825-1, FDA (CDRH) Part 1040.10*3)

Spot diameter

ø25 µm ø0.000984"*4

Linearity

±0.1 µm ±0.000004" (when n=3.5)*5

Resolution

0.001 µm *6

Sampling cycle

200 µs

LED display

Target near center of measurement range : green lights. Target within measurement range : orange lights.Target outside measurement range : flashes orange.

Temperature fluctuation

Environmental resistance - Enclosure rating

IP64

Environmental resistance - Ambient light

Incandescent lamp or Fluorescent lamp: 10,000 lux max.

Environmental resistance - Ambient temperature

0 to +50 °C 32 to 122 °F

Environmental resistance - Relative humidity

35 to 85 % RH (No condensation)

Environmental resistance - Vibration resistance

10 to 55 Hz, Double amplitude 1.5 mm 0.06", 2 hours in each of the X, Y, and Z directions

Material

SUS

Weight

Approx. 70 g (including cable)

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